DIAFIM
ACCELERATE FAULT INJECTION ON FPGA BASED PROTOTYPES
DIAFIM
QUICKLY ASSESS THE VULNERABILITY OF YOUR DIGITAL ASICs AND IP CIRCUITS
DIAFIM
CARRY OUT TEST FAULT INJECTION WITHIN SYSTEM CONTEXT
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ICs Faults Vulnerability Tests (SET/SEU*)

Test Services

We provide tests services to study the vulnerability and the safety of your digital IP by using fault injection on DiaFim FPGA-based platform

Elements studied:

  • Vulnerability: rates and types of errors observed
  • Variations in sensitivity according to the test scenarios
  • Areas of sensitivity

Customer supply for the study

Tests strategies (for each test scenario)

  • Faults type: Bip-Flip, Stuck at 1, Stuck at 0
  • Minimal number of tests
  • Targeted sub-parts
  • Targeted cycles
  • Minimal injection points coverage
  • Minimal injection cycles coverage
  • Initialization steps
  • Input data
  • Expected output data

Study:

  • Specification of technical prerequisites and test campaign scenarios
  • Circuit instrumentation, creation of personalized test bench
  • Execution of test campaigns
  • Comparison of test results with reference data (without fault injections)
  • Generation of a report on the results and statistics of all the tests
  • Recommendations

Delivery:

  • Specifications, reports, and test parameters
  • Technical discussion

(*) SET Single Event Transient – SEU Single Event Upset